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Title:FACTORS AFFECTING THE PERFORMANCE OF DIFFERENT THIN-FILM PV TECHNOLOGIES
Issue date:2012/05/24
Description:ABSTRACT: This paper reports the results of high-precision energy yield measurements of different PV module technologies performed at the headquarters of TÜV Rheinland, Cologne, from May 2010 through April 2011. The investigations refer to 12 specimens each subjected to a separate electronic load for automated MPP tracking and V/Icurve measurements. Modules based on CdTe, CI(G)S, a-Si, a-Si/μ-Si, a-Si/a-Si and c-Si (mono and poly) semiconductors were analyzed and compared in a ranking with regard to the achieved specific energy yield. We consider the individual reasons for differences in performance, such as low irradiance behaviour, temperature coefficients, spectral irradiance effects and meta-instabilities of nominal power output, and describe the challenges in gathering high resolution measurement data.
Creator / Publisher:M. Schweiger, U. Jahn, W. Herrmann  /  IEA PVPS Task 13
Copyright:IEA PVPS Task 13
Filesize:764 Kilobyte
Filetype:pdf
Category:Public
Paper
2011
Task 13
Link:  
pap_ST3.1_Task_13_Sept_2011.pdf