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| Title: | FACTORS AFFECTING THE PERFORMANCE OF DIFFERENT THIN-FILM PV TECHNOLOGIES |
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| Issue date: | 2012/05/24 |
| Description: | ABSTRACT: This paper reports the results of high-precision energy yield measurements of different PV module technologies performed at the headquarters of TÜV Rheinland, Cologne, from May 2010 through April 2011. The investigations refer to 12 specimens each subjected to a separate electronic load for automated MPP tracking and V/Icurve measurements. Modules based on CdTe, CI(G)S, a-Si, a-Si/μ-Si, a-Si/a-Si and c-Si (mono and poly) semiconductors were analyzed and compared in a ranking with regard to the achieved specific energy yield. We consider the individual reasons for differences in performance, such as low irradiance behaviour, temperature coefficients, spectral irradiance effects and meta-instabilities of nominal power output, and describe the challenges in gathering high resolution measurement data. |
| Creator / Publisher: | M. Schweiger, U. Jahn, W. Herrmann / IEA PVPS Task 13 |
| Copyright: | IEA PVPS Task 13 |
| Filesize: | 764 Kilobyte |
| Filetype: | |
| Category: | Public Paper 2011 Task 13 |
| Link: |   pap_ST3.1_Task_13_Sept_2011.pdf |
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